The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
May. 07, 2018
Honeywell International Inc., Morris Plains, NJ (US);
Andrew John Trenchard, Romsey, GB;
Sanjay K. Dave, Bangalore, IN;
Christopher J. Webb, Scottsdale, AZ (US);
Michael Niemiec, Dexter, MI (US);
Mandar Vartak, Bangalore, IN;
Sriram Hallihole, Bangalore, IN;
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
A method includes obtaining data identifying values of one or more controlled variables associated with an industrial process controller. The method also includes identifying periods when at least one of the one or more controlled variables has been moved to an associated limit by the controller. The method further includes, for each identified period, (i) identifying a standard deviation of predicted values for the associated controlled variable and (ii) determining a control giveaway value for the associated controlled variable based on the standard deviation. The control giveaway value is associated with an offset between the associated controlled variable's average value and the associated limit. In addition, the method includes identifying variances in the one or more controlled variables using the control giveaway values and generating a graphical display identifying one or more impacts or causes for at least some of the variances.