The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Aug. 13, 2019
Canon Kabushiki Kaisha, Tokyo, JP;
Masayasu Teramura, Utsunomiya, JP;
Yu Miyajima, Utsunomiya, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
The optical scanning apparatus includes a deflecting unit that scans first and second (FaS) scanned surfaces in main scanning direction by deflecting FaS light fluxes incident on a first deflecting surface at different angles with respect to main scanning section in sub-scanning section, and a first optical element including FaS optical portions which guide FaS light fluxes deflected by deflecting unit to FaS scanned surfaces, respectively. An incident surface of first optical element projects most toward deflecting unit at a position of surface vertex on the incident surface in sub-scanning section including the surface vertex. At least one of FaS exit surfaces of FaS optical portions is a sagittal tilt surface. A distance between surface vertices on FaS exit surfaces in sub-scanning section including an incident position of axial ray is larger than the corresponding distance in sub-scanning section including an incident position of outermost off-axis ray.