The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Dec. 22, 2017
Applicants:

Ming Zhang, Fremont, CA (US);

Libo Weng, San Jose, CA (US);

Cheng Zhao, San Jose, CA (US);

Yin Qian, Milpitas, CA (US);

Chia-chun Miao, Sunnyvale, CA (US);

Zhiqiang Lin, San Jose, CA (US);

Dyson H. Tai, San Jose, CA (US);

Inventors:

Ming Zhang, Fremont, CA (US);

Libo Weng, San Jose, CA (US);

Cheng Zhao, San Jose, CA (US);

Yin Qian, Milpitas, CA (US);

Chia-Chun Miao, Sunnyvale, CA (US);

Zhiqiang Lin, San Jose, CA (US);

Dyson H. Tai, San Jose, CA (US);

Assignee:

OmniVision Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1362 (2006.01); G02F 1/1343 (2006.01); G02F 1/1337 (2006.01); G02F 1/1341 (2006.01); G02F 1/1339 (2006.01); G02F 1/1335 (2006.01); G02F 1/1333 (2006.01);
U.S. Cl.
CPC ...
G02F 1/136277 (2013.01); G02F 1/1337 (2013.01); G02F 1/1341 (2013.01); G02F 1/13394 (2013.01); G02F 1/13439 (2013.01); G02F 1/133502 (2013.01); G02F 2001/13398 (2013.01); G02F 2001/133302 (2013.01); G02F 2001/133357 (2013.01); G02F 2001/133565 (2013.01);
Abstract

A liquid crystal on silicon (LCOS) panel comprises: a silicon substrate having silicon circuit within the silicon substrate; a plurality of metal electrodes disposed on the silicon substrate, where the plurality of metal electrodes are periodically formed on the silicon substrate; a dielectric material disposed in and filling gaps between adjacent metal electrodes; and an oxide layer disposed on the plurality of metal electrodes and the dielectric material in the gaps between adjacent metal electrodes; where the refractive index of the dielectric material is higher than the refractive index of the oxide layer.


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