The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Oct. 22, 2019
Applicant:

Korea Basic Science Institute, Daejeon, KR;

Inventors:

Dong Uk Kim, Daejeon, KR;

Ki Soo Chang, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); G02B 21/36 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/36 (2013.01); G02B 21/0032 (2013.01); H04N 5/33 (2013.01);
Abstract

Disclosed is a laser scanning based microscope apparatus including a light source configured to output a laser signal, a scanning unit configured to scan a heating sample with a first laser signal corresponding to a portion of the output laser signal, and output an optical signal reflected from the sample by the scanning to a first detector, the first detector configured to generate a first electrical signal through the reflected optical signal, a second detector configured to generate a second electrical signal through a second laser signal corresponding to a remaining portion of the output laser signal, and a controller configured to acquire a thermal image of the sample by performing a frequency domain analysis based on the first electrical signal and a differential electrical signal.


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