The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Dec. 13, 2018
Fujifilm Corporation, Minato-ku, Tokyo, JP;
Takashi Wakui, Ashigarakami-gun, JP;
FUJIFILM Corporation, Minato-Ku, Tokyo, JP;
Abstract
Provided are an imaging device, an imaging method and an imaging control program which make it possible to shorten an imaging time, and to capture an image of each observation region at an appropriate focusing position regardless of the state of installation of a culture vessel on a stage. In a case where an observation target is imaged multiple times, a focusing position of an observation region within a culture vessel is detected by auto-focus control during first imaging, and the first imaging of each observation region is performed using the focusing position. Next, the focusing position of a reference position is detected by auto-focus control during second imaging subsequent to the first imaging, and the focusing position of each observation region detected in the first imaging is corrected on the basis of the detected focusing position and the focusing position of the reference position in the first imaging.