The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Feb. 26, 2020
Osram Gmbh, Munich, DE;
Michael Eschey, Wehringen, DE;
Helmi Abidi, Munich, DE;
Osram GmbH, Munich, DE;
Abstract
A method for evaluating positioning parameters in a defined area, wherein the defined area is affected by at least three stationary access beam points and over which a grid pattern is laid with at least two grids, each grid having an anchor. An initial vector of positioning parameters is assigned to each anchor and a plurality of RSSI measurements are captured within the defined area by receiving signals from the at least three stationary access beam points. The plurality of RSSI measurement are clustered in a plurality of subsets, wherein the number of subsets corresponds to the number of the at least two grids. Finally, each subset of the plurality of subsets is associated with a respective one of the at least two grids and the initial vector is updated based on the subset of the plurality of subsets associated with the respective one of the at least two grids.