The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Feb. 02, 2018
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Jong Hoon Jung, Suwon-si, KR;
Dae Sik Kim, Suwon-si, KR;
Sung Yeol Kim, Suwon-si, KR;
Seung Yong Shin, Bucheon-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/44 (2020.01); G01J 1/44 (2006.01); G01R 1/073 (2006.01); G01R 31/26 (2020.01); G01J 3/50 (2006.01); G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
G01R 31/44 (2013.01); G01J 1/42 (2013.01); G01J 1/44 (2013.01); G01J 3/505 (2013.01); G01R 1/07314 (2013.01); G01R 31/2635 (2013.01); G01J 2001/4252 (2013.01);
Abstract
Provided are a wafer probe card that matches in one-to-one correspondence with an LED wafer by implementing a probe system having the same size as the LED wafer, and inspects brightness and wavelength of light emitted from a plurality of LEDs provided on the LED wafer at once by controlling the plurality of LEDs to emit light, an analysis apparatus including the same, and a method of fabricating the wafer probe card.