The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Jul. 18, 2018
Method for producing a semiconductor device by means of computer-aided development of test scenarios
Infineon Technologies Ag, Neubiberg, DE;
Oliver Frank, Linz, AT;
Christoph Hazott, Linz, AT;
Georg Krebelder, Ottensheim, AT;
Bruno Mariacher, Finkenstein, AT;
Otto Pfabigan, Villach, AT;
Sebastian Pointner, Weng im Innkreis, AT;
Ralf Reiterer, Linz, AT;
Florian Starzer, Ennsdorf bei Enns, AT;
Infineon Technologies AG, Neubiberg, DE;
Abstract
A method for producing a semiconductor device is described. In accordance with one example embodiment, the method comprises providing a virtual DUT in the form of a behavior model of the semiconductor device and developing at least one test in a test development environment for an automatic test equipment (ATE). In this case, commands are generated by means of the test development environment, which commands are converted into test signals by means of a software interface, which test signals are fed to the virtual DUT and are processable by the latter. The software interface processes response signals of the virtual DUT and reports information dependent on the response signals back to the test development environment.