The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Jun. 28, 2016
Applicant:

Osaka University, Osaka, JP;

Inventors:

Shintarou Hisatake, Osaka, JP;

Tadao Nagatsuma, Osaka, JP;

Hirohisa Uchida, Kyoto, JP;

Assignee:

Osaka University, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0885 (2013.01); G01R 29/0814 (2013.01); G01R 29/0892 (2013.01); G01R 29/0871 (2013.01);
Abstract

Provided is an electro-optic probe for detecting an electromagnetic wave, including: an electro-optic crystal; and an optical fiber optically coupled to the electro-optic crystal, wherein a direction of a unique axis of the electro-optic crystal and a polarization direction of light from the optical fiber that enters the electro-optic crystal are set to be in line with each other, or wherein a direction of a unique axis of the electro-optic crystal and a unique polarization direction of the optical fiber are set to be in line with each other.


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