The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Nov. 21, 2017
Fanuc Corporation, Yamanashi, JP;
Noboru Kurokami, Yamanashi, JP;
Naoki Sato, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
An abnormality occurrence presumption apparatus which presumes the occurrence of an abnormality in a telescopic cover attached to a machine tool performs supervised learning on the basis of a feature amount extracted from a physical quantity acquired during an operation of the machine tool and information related to an abnormality occurring in the telescopic cover, and stores the result of the learning. The abnormality occurrence presumption apparatus presumes an abnormality that may occur in the telescopic cover during the operation of the machine tool on the basis of the result of the learning and the feature amount extracted from the physical quantity.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile