The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Oct. 24, 2017
Applicant:

Laitram, L.l.c.;

Inventor:

William S. Murray, New Orleans, LA (US);

Assignee:

Laitram, L.L.C., Harahan, LA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/18 (2018.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01);
U.S. Cl.
CPC ...
G01N 23/18 (2013.01); G01N 23/04 (2013.01); G01N 23/083 (2013.01); G01N 2223/423 (2013.01); G01N 2223/643 (2013.01);
Abstract

Apparatus and method for detecting materials on a conveyor belt using multi-energy x-ray absorption imaging. A spectroscopic x-ray detector consisting of a line array of pixels receives x-rays from an x-ray source directed through the conveyor belt. The x-rays are attenuated as they pass through the belt and materials on the belt. The pixels each produce an energy spectrum of the received x-rays. The received energy spectrum of each pixel is related to the source x-ray spectrum to determine a measured attenuation, which is then related to an attenuation model that includes the attenuation coefficients of a set of preselected constituent materials expected to be in or on the belt. Mathematical regression is used to fit the measured attenuation to the attenuation model to find the thickness of each constituent material for each pixel.


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