The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Feb. 26, 2019
Applicants:

Bwxt Nuclear Operations Group, Inc., Lynchburg, VA (US);

Bwxt Nog Technologies, Inc., Lynchburg, VA (US);

Aaron C. Havener, Pittsburgh, PA (US);

Inventors:

Aaron C. Havener, Pittsburgh, PA (US);

James D. Jogerst, Forest, VA (US);

Thomas C. Mohr, Forest, VA (US);

Keith B. Rider, Prospect, VA (US);

Assignees:

BWXT Nuclear Operations Group, Inc., Lynchburg, VA (US);

BWXT NOG Technologies, Inc., Lynchburg, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/94 (2013.01); G01N 2021/8812 (2013.01); G01N 2021/8835 (2013.01);
Abstract

Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response.


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