The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Nov. 03, 2015
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Neda Cvijetic, San Jose, CA (US);
Giovanni Milione, Franklin Square, NY (US);
Ting Wang, West Windsor, NJ (US);
Assignee:
NEC Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/17 (2006.01); G01S 7/48 (2006.01); G01S 7/481 (2006.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01N 21/17 (2013.01); G01S 7/481 (2013.01); G01S 7/4802 (2013.01); G01S 17/89 (2013.01); G01N 2021/1793 (2013.01);
Abstract
A method and system for remote sensing using optical orbital angular momentum (OAM)-based spectroscopy for object recognition. The method includes applying an OAM state on a light beam to generate an optical OAM spectrum, transmitting the light beam on a remote object, receiving a reflected optical OAM spectrum associated with the remote object, and providing a high resolution image of the remote object based on the reflected optical OAM spectrum.