The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Nov. 02, 2016
Applicant:
Pegasor Oy, Tampere, FI;
Inventors:
Kauko Janka, Tampere, FI;
Erkka Saukko, Tampere, FI;
Assignee:
PEGASOR OY, Tampere, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/22 (2006.01); G01N 15/06 (2006.01); G01N 27/70 (2006.01); B03C 3/68 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 1/2247 (2013.01); B03C 3/68 (2013.01); G01N 15/0656 (2013.01); B03C 2201/24 (2013.01); B03C 2201/30 (2013.01); G01N 1/2252 (2013.01); G01N 27/70 (2013.01); G01N 2001/227 (2013.01); G01N 2001/2223 (2013.01); G01N 2015/0046 (2013.01);
Abstract
The present invention relates to an apparatus () and process for measuring characteristics of a particle flow. The measuring is done with two different cut-off diameters of a particle trap () of which one cut-off diameter is adjusted based on the measured particle characteristics.
Janka, Kauko. (2020). Apparatus and process for measuring characteristics of particle flow (U.S. Patent No. 10760997). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10760997
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