The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10760965 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 01, 2020

Filed:

Sep. 20, 2018
Applicant:

Nueon Inc., San Francisco, CA (US);

Inventors:

Robert G. Messerschmidt, Menlo Park, CA (US);

Howland D. T. Jones, Rio Rancho, NM (US);

Assignee:

NUEON INC., Menlo Park, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01N 21/03 (2006.01); G01N 21/552 (2014.01); G01N 21/25 (2006.01); G01N 33/49 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0267 (2013.01); G01J 3/0264 (2013.01); G01N 21/03 (2013.01); G01N 21/0303 (2013.01); G01N 21/25 (2013.01); G01N 21/552 (2013.01); G01N 33/49 (2013.01); G01N 2021/035 (2013.01); G01N 2021/0339 (2013.01); G01N 2021/0346 (2013.01);
Abstract

Described herein are methods and apparatus for spectroscopic analysis of samples. In many embodiments, an apparatus for providing spectroscopic analysis of a sample comprises a sample holder. For example, the sample holder may comprise a consumable single use sample holder that can be readily coupled to and removed from a measurement apparatus such as a spectrometer. The sample holder may comprise a measurement surface configured to receive the sample during measurement, wherein the measurement surface may comprise a porous mesh. The porous mesh can receive the sample to optimally configure the sample for spectroscopic measurement, as described in further detail herein.


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