The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Oct. 26, 2016
Applicant:
University of Kent AT Canterbury, Kent, GB;
Inventors:
Adrian Podoleanu, Canterbury, GB;
Sylvain Rivet, Plouarzel, FR;
Adrian Bradu, Faversham, GB;
Michael Maria, Copenhagen, DK;
Assignee:
UNIVERSITY OF KENT, Kent, GB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02083 (2013.01); G01B 9/02027 (2013.01); G01B 9/02091 (2013.01);
Abstract
The present invention related to an apparatus and method for master slave interferometry, referred to as Complex Master Slave (CMS). The method and apparatus can be used to provide complex-valued measurements of a signal reflected from an axial position inside an object or of signals reflected from points at several axial positions inside an object.