The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Mar. 08, 2019
Applicant:

Toto Ltd., Kitakyushu-shi, Fukuoka, JP;

Inventors:

Junichi Iwasawa, Kitakyushu, JP;

Hiroaki Ashizawa, Kitakyushu, JP;

Takuma Wada, Kitakyushu, JP;

Ryoto Takizawa, Kitakyushu, JP;

Toshihiro Aoshima, Kitakyushu, JP;

Yuuki Takahashi, Kitakyushu, JP;

Atsushi Kinjo, Kitakyushu, JP;

Assignee:

Toto Ltd., Fukuoka, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B 9/00 (2006.01); C04B 35/505 (2006.01); C01B 11/24 (2006.01); C01F 7/02 (2006.01); C01G 25/02 (2006.01); C04B 35/622 (2006.01); H01J 37/28 (2006.01); H01L 21/67 (2006.01); H01L 21/687 (2006.01); C01F 17/206 (2020.01); C01F 17/265 (2020.01);
U.S. Cl.
CPC ...
C04B 35/505 (2013.01); C01B 11/24 (2013.01); C01F 7/02 (2013.01); C01F 17/206 (2020.01); C01F 17/265 (2020.01); C01G 25/02 (2013.01); C04B 35/62222 (2013.01); H01J 37/28 (2013.01); H01L 21/67069 (2013.01); H01L 21/68757 (2013.01); C01P 2002/01 (2013.01); C01P 2002/60 (2013.01); C01P 2004/04 (2013.01); C01P 2006/80 (2013.01); C04B 2235/3225 (2013.01); C04B 2235/72 (2013.01); C04B 2235/781 (2013.01); C04B 2235/9669 (2013.01); H01J 2237/2802 (2013.01);
Abstract

Disclosed is provision of a ceramic coat having an excellent low-particle generation as well as a method for assessing the low-particle generation of the ceramic coat. A composite structure including a substrate and a structure which is formed on the substrate and has a surface, wherein the structure includes a polycrystalline ceramic and the composite structure has luminance Sa satisfying a specific value calculated from a TEM image analysis thereof, can be suitably used as an inner member of a semiconductor manufacturing apparatus required to have a low-particle generation.


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