The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Aug. 13, 2018
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Stylianos Perissakis, Graz, AT;

Martin Posch, Graz, AT;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60R 25/20 (2013.01); B60R 25/24 (2013.01); B60R 25/04 (2013.01); E05B 81/78 (2014.01); G07C 9/00 (2020.01); H04B 1/709 (2011.01); H04W 88/06 (2009.01);
U.S. Cl.
CPC ...
B60R 25/24 (2013.01); G07C 9/00309 (2013.01); H04B 1/709 (2013.01); H04W 88/06 (2013.01); G07C 2009/0038 (2013.01); G07C 2009/00325 (2013.01); G07C 2009/00555 (2013.01); G07C 2009/00793 (2013.01);
Abstract

The disclosure relates to pattern detection unit and associated method. The unit comprises a shift register configured to over-sample a multi-bit input signal such that each bit of the input signal is represented by a plurality of samples in the shift register; and a correlator configured to compare a target pattern with two or more sample-sets, each sample-set comprising a corresponding sample from each of the plurality of samples of each bit, and classify each compared sample-set as one of: an exact match; an inexact match; or a non-match to the target pattern in order to determine whether or not the input signal matches the target pattern.


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