The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Nov. 29, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Makoto Yamada, Yamanashi, JP;

Kenshirou Oono, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); B25J 19/02 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1669 (2013.01); B25J 9/1674 (2013.01); B25J 9/1697 (2013.01); B25J 19/023 (2013.01);
Abstract

A robot system is provided with: a plurality of robots; an image acquisition unit that can be attached and detached with respect to each of the robots and that acquires an image of an inspection target object; and a plurality of image inspection units that are respectively connected to the robots and that each inspect the inspection target object on the basis of the image acquired by the image acquisition unit. The image acquisition unit holds image-inspection data that includes optical property data indicating optical properties of the image acquisition unit and that is used in the inspection performed by the image inspection units, and transmits the image-inspection data to the image inspection unit that is connected to the robot to which the image acquisition unit is attached.


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