The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Mar. 08, 2018
Accuray Incorporated, Sunnyvale, CA (US);
Jonathan Cecil Chappelow, Campbell, CA (US);
Petr Jordan, Redwood City, CA (US);
Calvin Maurer, San Jose, CA (US);
Sarbjit Singh, San Jose, CA (US);
Andrew W. Fitting, Fremont, CA (US);
Andriy Myronenko, San Mateo, CA (US);
Jian Gao, San Jose, CA (US);
Accuray Incorporated, Sunnyvale, CA (US);
Abstract
A method includes determining a first estimate of leaf positions for a plurality of leaves of a multi-leaf collimator (MLC) in a reference coordinate space based on an image generated by an image-based aperture verification system, wherein the leaf positions for the plurality of leaves define an aperture for the MLC. The method further includes determining a second estimate of the leaf positions for the plurality of leaves in the reference coordinate space based on data from an additional source. The method further includes verifying the leaf positions for the plurality of leaves based on comparing the first estimate to the second estimate, wherein the leaf positions are verified if the first estimate deviates from the second estimate by less than a threshold value.