The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Feb. 03, 2016
Kabushiki Kaisha Topcon, Itabashi-ku, Tokyo, JP;
KABUSHIKI KAISHA TOPCON, Itabashi-ku, Tokyo, JP;
Abstract
An ophthalmological microscope system, having an illumination system that projects illumination light onto a subject's eye. A light receiving system guides returning light of the illumination light to an image sensor or an eyepiece system. An interference optical system splits light into measurement light and reference light and detects interference light generated from returning light of the measurement light and the reference light. A designation unit is used for designating an operation mode. When an observation priority mode (or an OCT priority mode) has been designated, a controller executes first light amount control that restricts light amount of the measurement light (or second light amount control that restricts light amount of the illumination light) to make total light amount of the illumination light and the measurement light equal to or less than a predetermined value.