The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Oct. 04, 2016
Koninklijke Philips N.v., Eindhoven, NL;
Lester Donald Miller, Highland Heights, OH (US);
Carolina Ribbing, Aachen, DE;
Dionys Van De Ven, Hamburg, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The invention relates to a device () for determining spatially dependent x-ray flux degradation and photon spectral change, a system () for determining spatially dependent x-ray flux degradation and photon spectral change for an x-ray tube (), a method for spatially dependent x-ray flux degradation and photon spectral change for an x-ray tube (), a computer program element for controlling such device () or system () for performing such method and a computer readable medium having stored such computer program element. The device () for determining spatially dependent x-ray flux degradation and photon spectral change comprises an acquisition unit (), a processing unit (), a calculation unit (), and a combination unit (). The acquisition unit () is configured to acquire x-ray flux degradation data for the x-ray tube (). The processing unit () is configured to process the x-ray flux degradation data into spatially dependent flux degradation data. The calculation unit () is configured to calculate at least a photon spectral change of the x-ray tube () and to convert the photon spectral change into a spatially dependent spectrum. The combination unit () is configured to combine the spatially dependent flux degradation data and the spatially dependent spectrum.