The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Jan. 27, 2017
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Seiichiro Tabata, Tokyo, JP;

Shinichiro Yamada, Tokyo, JP;

Masayoshi Kanno, Tokyo, JP;

Tsutomu Noguchi, Tokyo, JP;

Takeshi Horie, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01M 4/587 (2010.01); H01M 4/583 (2010.01); H01M 4/02 (2006.01); H01G 11/24 (2013.01); H01G 11/34 (2013.01); H01G 9/00 (2006.01); B01J 20/28 (2006.01); B01J 20/20 (2006.01); C01B 32/00 (2017.01); C01B 32/336 (2017.01); C01B 32/30 (2017.01); H01M 10/0525 (2010.01);
U.S. Cl.
CPC ...
H01M 4/587 (2013.01); B01J 20/20 (2013.01); B01J 20/28033 (2013.01); B01J 20/28059 (2013.01); B01J 20/28061 (2013.01); B01J 20/28071 (2013.01); C01B 32/00 (2017.08); C01B 32/30 (2017.08); C01B 32/336 (2017.08); H01G 11/24 (2013.01); H01G 11/34 (2013.01); H01M 4/583 (2013.01); C01P 2006/12 (2013.01); C01P 2006/14 (2013.01); H01M 10/0525 (2013.01); H01M 2004/021 (2013.01); H01M 2004/027 (2013.01); H01M 2220/30 (2013.01); Y02E 60/13 (2013.01);
Abstract

A porous carbon material is provided. The porous carbon material having a value of specific surface area of at least 10 m2/g as measured by a nitrogen BET method, a pore volume of at least 0.1 cm3/g as measured by a BJH method and a MP method, and a R value of 1.5 or greater, wherein the R value is expressed as R=B/A, wherein A is an intensity at an intersection between a baseline of a diffraction peak of a (002) plane as obtained based on powdery X-ray diffractometry of the porous carbon material and a perpendicular line downwardly drawn from the diffraction peak of the (002) plane, and wherein B is an intensity of the diffraction peak of the (002) plane.


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