The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Sep. 06, 2018
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Hee Chul Lee, Daejeon, KR;

Young Tak Roh, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/556 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 23/556 (2013.01); H01L 29/0847 (2013.01); H01L 29/1083 (2013.01); H01L 29/1095 (2013.01); H01L 29/7832 (2013.01);
Abstract

Provided is a radiation-tolerant unit MOSFET to block a leakage current path caused by a total ionizing dose effect and reduce influence of a current pulse generated due to a single event effect. The radiation-tolerant unit MOSFET includes a poly gate layer for designating a gate region and at least one dummy gate region, a source and a drain, and a P+ layer and a P-active layer for specifying a P+ region to the source and the drain, and a dummy drain allowing application of a voltage. An electronic part that may normally operate is provided even a radiation environment where particle radiation and electromagnetic radiation are present.


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Lee, Hee. (2020). Radiation-tolerant unit mosfet hardened against single event effect and total ionizing dose effect (U.S. Patent No. 10756028). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10756028

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