The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Dec. 17, 2018
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Niles Yang, San Jose, CA (US);

Pitamber Shukla, San Jose, CA (US);

Mohan Dunga, San Jose, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/56 (2006.01); G11C 29/52 (2006.01); G11C 29/42 (2006.01); G11C 29/44 (2006.01); G06F 11/10 (2006.01); G11C 11/4074 (2006.01); G11C 11/4099 (2006.01); G11C 16/28 (2006.01);
U.S. Cl.
CPC ...
G11C 29/52 (2013.01); G06F 11/1048 (2013.01); G06F 11/1068 (2013.01); G11C 11/4074 (2013.01); G11C 11/4099 (2013.01); G11C 16/28 (2013.01); G11C 29/42 (2013.01); G11C 29/44 (2013.01);
Abstract

Recovering data from a faulty memory block in a memory system. Various methods include: reading a target word line in a memory block to obtain a first data; determining the first data has an uncorrectable error; and then adjust bias parameters of a first group of neighboring word lines within the memory block, where adjusting bias parameters creates a first adjusted bias parameters; and reading the target word line using the adjusted bias parameters to obtain second data from the target word line. The method also includes determining the second data has a second uncorrectable error; and then adjusting bias parameters of a second group of lines within the memory block, where adjusting the bias parameters of the second group creates second adjusted bias parameters; and reading the target word line using the first and second adjusted bias parameters to obtain a third data from the target word line.


Find Patent Forward Citations

Loading…