The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Aug. 01, 2019
Applicant:

Shanghai Cambricon Information Technology Co., Ltd, Pudong New Area, CN;

Inventors:

Shaoli Liu, Pudong New Area, CN;

Xuda Zhou, Pudong New Area, CN;

Zidong Du, Pudong New Area, CN;

Daofu Liu, Pudong New Area, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/41 (2006.01); G11C 11/419 (2006.01); G11C 29/42 (2006.01); G06N 3/063 (2006.01); G11C 11/16 (2006.01);
U.S. Cl.
CPC ...
G11C 11/419 (2013.01); G06N 3/063 (2013.01); G11C 11/1655 (2013.01); G11C 11/1657 (2013.01); G11C 29/42 (2013.01);
Abstract

Aspect for storage device with fault tolerance capability for neural networks are described herein. The aspects may include a first storage unit of a storage device. The first storage unit is configured to store one or more first bits of data and the data includes floating point type data and fixed point type data. The first bits include one or more sign bits of the floating point type data and the fixed point type data. The aspect may further include a second storage unit of the storage device. The second storage unit may be configured to store one or more second bits of the data. In some examples, the first storage unit may include an ECC memory and the second storage unit may include a non-ECC memory. The ECC memory may include an ECC check Dynamic Random Access Memory and an ECC check Static Random Access Memory.


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