The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

May. 06, 2019
Applicant:

Wenzhou University, Zhejiang, CN;

Inventors:

Gang Li, Zhejiang, CN;

Pengjun Wang, Zhejiang, CN;

Yuejun Zhang, Zhejiang, CN;

Bo Chen, Zhejiang, CN;

Assignee:

Wenzhou University, Zhejiang, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/419 (2006.01); G11C 11/412 (2006.01); G11C 11/417 (2006.01); G11C 11/418 (2006.01); G11C 11/56 (2006.01); H01L 27/28 (2006.01);
U.S. Cl.
CPC ...
G11C 11/412 (2013.01); G11C 11/417 (2013.01); G11C 11/418 (2013.01); G11C 11/419 (2013.01); G11C 11/56 (2013.01); H01L 27/283 (2013.01);
Abstract

A carbon nanotube ternary SRAM cell with an improved stability and low standby power comprises a write bit line, a read bit line, a column select bit line, an inverted column select bit line, a write word line, an inverted write word line, a read word line, an inverted read word line, a first P-type CNFET, a second P-type CNFET, a third P-type CNFET, a fourth P-type CNFET, a fifth P-type CNFET, a sixth P-type CNFET, a seventh P-type CNFET, an eighth P-type CNFET, a ninth P-type CNFET, a first N-type CNFET, a second N-type CNFET, a third N-type CNFET, a fourth N-type CNFET, a fifth N-type CNFET, a sixth N-type CNFET, a seventh CNFET, an eighth N-type CNFET and a ninth N-type CNFET. The carbon nanotube ternary SRAM cell has the advantages of being lower in power consumption, capable of solving the half-select problem and the read-disturb problem and high in static noise margin.


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