The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Apr. 19, 2019
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Hung Sheng Lin, San Jose, CA (US);

Shengkui Gao, San Jose, CA (US);

Hyunwoo Nho, Palo Alto, CA (US);

Chin-Wei Lin, San Jose, CA (US);

Mohammad B. Vahid Far, San Jose, CA (US);

Jie Won Ryu, Santa Clara, CA (US);

Kingsuk Brahma, Mountain View, CA (US);

Junhua Tan, Satatoga, CA (US);

Sun-Il Chang, San Jose, CA (US);

Shinya Ono, Cupertino, CA (US);

Jesse Aaron Richmond, San Francisco, CA (US);

Yafei Bi, Los Altos Hills, CA (US);

Derek K. Shaeffer, Redwood City, CA (US);

Myungjoon Choi, Sunnyvale, CA (US);

Shiping Shen, Cupertino, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 2310/0291 (2013.01); G09G 2320/029 (2013.01); G09G 2320/041 (2013.01); G09G 2320/043 (2013.01); G09G 2330/06 (2013.01); G09G 2330/12 (2013.01);
Abstract

Systems and methods are provided for differential sensing (DS), difference-differential sensing (DDS), correlated double sampling (CDS), correlated-correlated double sampling (CDS-CDS) and/or programmable capacitor matching to reduce display panel sensing noise. An electronic device may include one or more processors that generate image data according to sensing operations. The one or more processors may reference a sensing pattern as part of sensing operations. Applying test sensing signals based on the sensing pattern may help reduce error associated with sensing operations.


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