The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Apr. 18, 2018
International Business Machines Corporation, Armonk, NY (US);
Franco Stellari, Waldwick, NJ (US);
Chung-Ching Lin, White Plains, NY (US);
Peilin Song, White Plains, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Systems, computer-implemented methods, and computer program products to focus a microscope. A system can comprise a memory that stores computer executable components and a processor that executes the computer executable components stored in the memory. The computer executable components can comprise an analyzer component that can analyze sub-images of respective sample images to identify one or more sub-images having a maximized variance of a gradient derivative corresponding to the one or more sub-images. The respective sample images can be acquired at one or more focal positions along an optical axis of a microscope. The computer executable components can further comprise a selection component that can select an image, from the respective sample images, that comprises the one or more sub-images identified. The computer executable components can also comprise a focus component that, based on a focal position corresponding to the image selected, can focus the microscope to the focal position.