The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Apr. 08, 2016
President and Fellows of Harvard College, Cambridge, MA (US);
Nikon Corporation, Tokyo, JP;
Lee L. Rubin, Wellesley, MA (US);
Yasujiro Kiyota, Tokyo, JP;
Chieko Nakada, Okamoto, JP;
Keiichi Niikura, Kanagawa, JP;
Kathleen L. Pfaff, Needham, MA (US);
President and Fellows of Harvard College, Cambridge, MA (US);
Nikon Corporation, Tokyo, JP;
Abstract
Provided herein are methods for analysis of target cells on a population or individual basis, including before and after contact with a stimulus in order to determine the effect of such stimulus on the target cells. Also provided are devices for performing such methods. The analysis methods involve identifying and measuring or tracking morphological changes that occur in target cells over a period of time. Tracking is accomplished using imaging systems capable of imaging target cells individually over a period of time either continuously or at discrete intervals of time.