The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Jan. 19, 2018
Sasith Maduranga Rajasooriya, Franklin, OH (US);
Chris Peter Tsokos, Tampa, FL (US);
Pubudu Kalpani K Hitigala Kaluarachchilage, Franklin, OH (US);
Sasith Maduranga Rajasooriya, Franklin, OH (US);
Chris Peter Tsokos, Tampa, FL (US);
Pubudu Kalpani K Hitigala Kaluarachchilage, Franklin, OH (US);
University of South Florida, Tampa, FL (US);
Abstract
Procedures to identify the probabilities for different states in a vulnerability life cycle are described. The probabilities are used to develop a number of statistical models to evaluate the risk factor of a particular vulnerability at time 't'. A transition probability matrix of all states of a particular vulnerability as a function of time is also described. A Markov chain process can be iterated to reach a steady state of the transition probability matrix, with the initial probabilities reaching the absorbing states, including exploited and patched states. A risk factor is also introduced for use as an index of the risk of a vulnerability being exploited. Finally, statistical models that can calculate the risk factor more conveniently without going through the Markovian process are described.