The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Jan. 20, 2017
Bank of America Corporation, Charlotte, NC (US);
Kumaresan Karuppiah, Chennai, IN;
Seshidhar R. Ammasani, Charlotte, NC (US);
Bank of America Corporation, Charlotte, NC (US);
Abstract
A system for analyzing the runtime impact of data files on data extraction, transformation, and loading (ETL) jobs typically includes a processor, a memory, and a runtime impact analysis module stored in the memory. The runtime impact analysis module is typically configured for: receiving a user input comprising a designator of a data repository from a user; receiving an ETL job list file from one or more ETL servers; for each ETL job invocation name in the ETL job list file: querying the one or more ETL servers for runtime information, receiving the runtime information from the one or more ETL servers, searching the runtime information for the designator of the data repository, and if the designator of the data repository is identified in the runtime information, adding the ETL job invocation name to an impacted ETL job file; and providing the impacted ETL job file to the user.