The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Jul. 16, 2018
International Business Machines Corporation, Armonk, NY (US);
Mark Robert Funk, Mantorville, MN (US);
Aaron Christoph Sawdey, Cannon Falls, MN (US);
Philip Lee Vitale, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Systems, methods and computer program products assess processor performance metrics by monitoring probes constructed using instruction sequences. A first probe value can be determined from execution of a broad spectrum probe in an execution environment. In response to determining that the first probe value is not a first expected probe value, a targeted probe providing a second probe value directed to a subsystem of the execution environment, a feature of the subsystem, or a component of the execution environment is executed. In response to determining that the second probe value is not a second expected probe value, a differential between the second probe value and the second expected probe value can be used to determine that a bottleneck exists in at least one of the subsystem of the execution environment, the feature of the subsystem, or the component of the execution environment.