The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Mar. 15, 2016
Applicant:
Wisconsin Alumni Research Foundation, Madison, WI (US);
Inventors:
Karthikeyan Sankaralingam, Madison, WI (US);
Newsha Ardalani, Madison, WI (US);
Urmish Thakker, Madison, WI (US);
Assignee:
Wisconsin Alumni Research Foundation, Madison, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 8/41 (2018.01); G06F 8/75 (2018.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06F 11/30 (2013.01); G06F 8/42 (2013.01); G06F 8/443 (2013.01); G06F 8/75 (2013.01); G06N 5/025 (2013.01);
Abstract
The amount of speed-up that can be obtained by optimizing the program to run on a different architecture is determined by static measurements of the program. Multiple such static measurements are processed by a machine learning system after being discretized to alter their accuracy vs precision. Static analysis requires less analysis overhead and permits analysis of program portions to optimize allocation of porting resources on a large program.