The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Jan. 28, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Sai Zeng, Yorktown Heights, NY (US);

Alexei Karve, Mohegan Lake, NY (US);

Ubaid Ullah Hafeez, Stony Brook, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/65 (2018.01); G06F 9/50 (2006.01); G06F 9/455 (2018.01); H04L 29/08 (2006.01); H04L 29/06 (2006.01); G06F 8/61 (2018.01);
U.S. Cl.
CPC ...
G06F 8/65 (2013.01); G06F 8/62 (2013.01); G06F 9/45558 (2013.01); G06F 9/5038 (2013.01); G06F 9/5077 (2013.01); H04L 63/1433 (2013.01); H04L 67/34 (2013.01);
Abstract

Managing performing patches on a workload associated with a computing platform comprising: identify the workload associated with the computing platform, wherein the workload can comprise a first workload portion upon which a first subset of patches can be performed offline and a second workload portion upon which a second subset of patches can be performed online; determine, for the first workload portion, a portion of the first subset of patches that can be performed within a maintenance time window while offline based on vulnerability scores of patches of the first subset of patches, and determine, for the second workload portion, the second subset of patches that can be performed while online; and determine the vulnerability scores of the patches of the first subset of patches based on importance levels of the patches.


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