The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Mar. 14, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Chikara Tango, Yamanashi, JP;

Masahiro Murota, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 15/02 (2006.01); B08B 3/02 (2006.01); G06N 20/00 (2019.01); B08B 13/00 (2006.01); G05B 13/02 (2006.01); G05B 19/406 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G05B 15/02 (2013.01); B08B 3/024 (2013.01); B08B 13/00 (2013.01); G05B 13/0265 (2013.01); G05B 19/406 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01);
Abstract

A cleaning process optimization device includes a machine learning device that learns a cleaning condition when cleaning an object to be cleaned. The machine learning device includes: a state observation unit that observes cleaning condition data indicating the cleaning condition, and contamination state data indicating a contamination state of the object to be cleaned measured before cleaning as a state variable representing a current state of environment; a determination data acquisition unit that acquires determination data indicating an adequacy determination result on accuracy of a contamination state of the object to be cleaned after cleaning; and a learning unit that learns the cleaning condition when cleaning the object to be cleaned in association with the contamination state data using the state variable and the determination data.


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