The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Aug. 14, 2019
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Masayasu Teramura, Utsunomiya, JP;

Yu Miyajima, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/10 (2006.01); G03G 15/04 (2006.01);
U.S. Cl.
CPC ...
G02B 26/105 (2013.01); G03G 15/0409 (2013.01); G03G 2215/0402 (2013.01);
Abstract

An optical scanning apparatus includes first and second deflecting units, and first and second imaging optical systems to guide first and second light fluxes deflected by the first and second deflecting units to first and second scanned surfaces. The first and second imaging optical systems include first and second imaging elements having the largest refractive power in a sub-scanning section. A distance on an optical path between the first deflecting unit and the first imaging element is shorter than that between the second deflecting unit and the second imaging element. The optical scanning apparatus satisfies: where N, d, ϕ, and ϕare a refractive index, a thickness on an optical axis, a refractive power in a sub-scanning section, and a refractive power in the sub-scanning section of an incident surface, of the first imaging element, and N, d, ϕ, and ϕare equivalents of the second imaging element.


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