The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Sep. 27, 2016
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Paul Borrel, Rio de Janeiro, BR;
Paulo Rodrigo Cavalin, Rio de Janeiro, BR;
Carlos Raoni de Alencar Mendes, Rio de Janeiro, BR;
Matthias Kormaksson, Rio de Janeiro, BR;
Carmen Nilda Mena Paz, Rio de Janeiro, BR;
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01V 99/00 (2009.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06N 3/02 (2006.01);
U.S. Cl.
CPC ...
G01V 99/005 (2013.01); G06K 9/4604 (2013.01); G01V 2210/646 (2013.01); G06K 9/6254 (2013.01); G06N 3/02 (2013.01);
Abstract
A fracture pattern characterization method, system, and computer program product, include classifying fracture patterns of reservoir layers using a correlation of reservoir information associated with target images and the target images extracted from a database and determining a fracture pattern characterization of a new reservoir layer input based on the classified fracture patterns.