The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Dec. 01, 2014
Applicant:

Toshiba Medical Systems Corporation, Otawara-shi, Tochigi-ken, JP;

Inventor:

Kiyomi Ooshima, Nasushiobara Tochigi, JP;

Assignee:

TOSHIBA MEDICAL SYSTEMS CORPORATION, Otawara-Shi, Tochigi-Ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/567 (2006.01); G01R 33/56 (2006.01); G01R 33/483 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5676 (2013.01); G01R 33/483 (2013.01); G01R 33/4835 (2013.01); G01R 33/5608 (2013.01); G01R 33/56509 (2013.01);
Abstract

A magnetic resonance imaging apparatus according to an embodiment includes a processor and a memory. The memory stores processor-executable instructions that cause the processor to perform an application region scan for acquiring data on an area covering a diaphragm in order to position an application region of a motion detection pulse and a multi-slice scan for acquiring first multi-slice data on an area covering a heart; and acquire a slice image of the heart that is positioned using the first multi-slice data, with application of the motion detection pulse. In acquiring the slice image, when breathing motion of a subject is continuously out of an allowable range for a given period, the processor corrects a position of the application region by calculation using the second multi-slice data acquired by performing the multi-slice scan again and a positional relationship obtained by the application region scan and the multi-slice scan.


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