The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Oct. 28, 2016
Applicant:

Paul Scherrer Institut, Villigen PSI, CH;

Inventors:

Takashi Tomizaki, Baden, CH;

Soichiro Tsujino, Endingen, CH;

Assignee:

Paul Scherrer Institut, Villigen PSI, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20025 (2018.01); G10K 15/00 (2006.01); B01L 3/02 (2006.01); B01L 3/06 (2006.01); G01N 23/207 (2018.01);
U.S. Cl.
CPC ...
G01N 23/20025 (2013.01); B01L 3/0241 (2013.01); B01L 3/06 (2013.01); G01N 23/207 (2013.01); G10K 15/00 (2013.01); B01L 2200/0626 (2013.01); B01L 2400/0439 (2013.01); G01N 2223/0566 (2013.01); G01N 2223/3306 (2013.01);
Abstract

A method and a system for resolving a crystal structure of a crystal at atomic resolution by collecting X-ray diffraction images. The method includes the steps: a) ejecting a droplet of fluid comprising single or multiple of crystal into an ultrasonic acoustic levitator; b) levitating the droplet of fluid with the crystal in the ultrasonic acoustic levitator; b) monitoring the position and the spinning of the droplet with a visualization apparatus; c) applying X-ray to the crystal, the X-ray stemming from an X-ray source; and d) detecting the X-ray diffraction images from the crystal irradiated by the X-ray source by an X-ray detector being capable to capture two dimensional diffraction patterns.


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