The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Nov. 21, 2017
Xieon Networks S.à.r.l., Luxembourg, LU;
Lutz Rapp, Deisenhofen, DE;
Xieon Networks S.à.r.l., Luxembourg, LU;
Abstract
A method of distinguishing whether a detected change in reflected power in an optical time domain reflectometer (OTDR) measurement carried out in a fiber optic transmission system () using an OTDR is caused by a an event causing actual attenuation or a change in a mode field diameter, comprising the steps of emitting a succession of first sampling light pulses of a first wavelength into the fiber optic transmission system () while a pumping signal with a second wavelength is emitted into the fiber optic transmission system (), and measuring a first OTDR trace (') resulting from the reflection of the first sampling light pulses in the fiber optic transmission system (), such that the first sampling light pulses and their reflections interact with the pumping signal via stimulated Raman scattering. The method further comprises a step () of determining, based at least on information extracted from the first OTDR trace (′), whether the detected change is mainly due to an event causing actual attenuation or to a change in the mode field diameter in the fiber optic transmission system ().