The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Mar. 01, 2018
Yaskawa America, Inc., Waukegan, IL (US);
John Charles Rogers, Danville, CA (US);
Clark Thomas Tella, San Francisco, CA (US);
YASKAWA AMERICA, INC., Waukegan, IL (US);
Abstract
A testing apparatus for minimizing runout of a rotating assembly includes a measurement device and a runout evaluator. The measurement device measures a distance to a surface. The runout evaluator obtains a first runout of a surface of a first member of the rotating assembly from the measurement device. The first runout has a magnitude and a phase. The runout evaluator obtains a second runout of a surface of a second member of the rotating assembly from the measurement device. The second runout has a magnitude and a phase. The runout evaluator determines a rotational position of the first member relative to the second member which results in a reduced runout of the rotating assembly. The determination of the rotational position is based on the magnitude and the phase of the first runout and the magnitude and the phase of the second runout.