The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Apr. 22, 2016
Kistler Holding Ag, Winterthur, CH;
Giovanni Mastrogiacomo, Zurich, CH;
Sandro Brandenberger, Andelfingen, CH;
Paul Furter, Russikon, CH;
Reinhard Staub, Herrliberg, CH;
Rolf Thiel, Baenk, CH;
Claudio Cavalloni, Regensdorf, CH;
KISTLER HOLDING, AG, Winterthur, CH;
Abstract
A contact force testing apparatus includes a measuring sensor that can be contacted with an electrical contact element and measures a contact force (F) of a contact with the electrical contact element. The measuring sensor includes piezoelectric material that receives the contact force (F) in a contact region and produces polarization charges. The measuring sensor includes an acceptor electrode that is completely surrounded by piezoelectric material in the contact region in the direction of a thickness extension of the measuring sensor and receives the polarization charges. A method is provided for the use of such a contact force testing apparatus, and a method is provided for producing such a contact force testing apparatus.