The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Jul. 10, 2018
Rnd-isan, Ltd, Troitsk, Moscow, RU;
Dmitriy Borisovich Abramenko, Moscow, RU;
Vladimir Mikhailovich Krivtsun, Moscow, RU;
Aleksander Petrovich Shevelko, Moscow, RU;
Oleg Feliksovich Yakushev, Moscow region, RU;
RnD-ISAN, Ltd, Troitsk, Moscow, RU;
Abstract
The invention relates to a compact wideband vacuum ultraviolet (VUV) and soft X-ray grazing incidence spectrometer based on a plane amplitude diffraction grating. The spectrometer enables simultaneous detection of a VUV spectrum in a positive first order of diffraction and a negative first order of diffraction. The technical result of the invention is that of recording a spectrum in a wide spectral range (3-200 nm) with a moderate spectral resolution (λ/δλ˜15-30) and with a significantly higher spectral resolution (λ/δλ˜100-200) in a narrow soft X-ray or extreme ultraviolet range with the possibility of measuring the absolute radiation output in these regions of the spectrum.