The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Oct. 03, 2017
Applicant:
Lockheed Martin Corporation, Bethesda, MD (US);
Inventors:
Alan Lee Duncan, Sunnyvale, CA (US);
Richard Lee Kendrick, San Mateo, CA (US);
Assignee:
LOCKHEED MARTIN CORPORATION, Bethesda, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/18 (2006.01); G01N 21/359 (2014.01); G01N 21/25 (2006.01); G01J 3/28 (2006.01); G01J 3/02 (2006.01); G02B 6/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/1895 (2013.01); G01J 3/0208 (2013.01); G01J 3/0232 (2013.01); G01J 3/2823 (2013.01); G01N 21/255 (2013.01); G01N 21/359 (2013.01); G02B 6/12009 (2013.01); G01J 2003/2826 (2013.01); G01N 2201/0873 (2013.01);
Abstract
An apparatus includes multiple photonic integrated circuit (PIC) optical spectrometers, and an imaging plane coupled to the PIC optical spectrometers. Each PIC optical spectrometer includes multiple semiconductor chip layers. Each semiconductor chip layer includes multiple arrayed waveguide gratings (AWGs) and a number of on-chip optical detectors.