The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Jun. 28, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Palanivel A. Kodeswaran, Bangalore, IN;

Ravindranath Kokku, Hyderabad, IN;

Sayandeep Sen, Bangalore, IN;

Mudhakar Srivatsa, White Plains, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 3/08 (2006.01); G01D 18/00 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G01D 3/08 (2013.01); G01D 18/00 (2013.01); G06N 7/005 (2013.01);
Abstract

Methods and arrangements for identifying failed sensors in a system of interconnected devices. A contemplated method includes: utilizing at least one processor to execute computer code that performs the steps of: receiving data from a first plurality of sensors, each sensor being operatively coupled to a device within a system of interconnected devices; associating the data received with an activity; comparing the data received with previously stored data associated with the living activity; detecting, based on the comparing, an anomaly associated with at least one of the first plurality of sensors, wherein the anomaly indicates a problem with the at least one of the first plurality of sensors; and recording, at a data storage location, the anomaly, wherein the data storage location stores data associated with previously identified anomalies. Other variants and embodiments are broadly contemplated herein.


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