The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Nov. 21, 2019
Applicant:

National Central University, Taoyuan, TW;

Inventors:

Wei-Hung Su, Kaohsiung, TW;

Yeh-Wei Yu, Taoyuan, TW;

Ching-Cherng Sun, Taoyuan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2518 (2013.01); G01B 11/24 (2013.01); G01B 11/2441 (2013.01); G01B 11/25 (2013.01); G01B 11/2513 (2013.01);
Abstract

A method for reconstructing a surface of an object includes the steps as follows. A light beam is modulated by a spatial light modulator (SLM) and is projected to form a pattern, wherein the pattern has a transmittance distribution in a cosine distribution such that the pattern is formed to become a fringe pattern with a periodic change. A first impulse and a second impulse present within a first period and a second period of the cosine distribution, wherein a position where the first impulse occurs within the first period and a position where the second impulse occurs within the second period are different. The light beam is guided to an object so as to form a scan pattern on the object. The scan pattern is read. According to the scan pattern, a surface profile of the object is calculated.


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