The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Jun. 08, 2018
Applicant:
Dentsply Sirona Inc., York, PA (US);
Inventors:
Michael Tewes, Bruhl, DE;
Markus Berner, Bulach, CH;
Assignee:
DENTSPLY SIRONA Inc., York, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G01B 11/2518 (2013.01);
Abstract
A device, method and system for utilizing an optical array generator, confocal measurement/depth of focus techniques to generate dynamic patterns in a camera for projection onto the surface of an object for three-dimensional (3D) measurement. Projected light patterns are used to generate optical features on the surface of an object to be measured and optical 3D measuring methods which operate according to triangulation, confocal and depth of focus principles are used to measure the object.