The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Oct. 19, 2018
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Daichi Watanabe, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A three-dimensional form measurement device includes: an interference fringe projector that scans an interference fringe and projects one of a plurality of interference fringe patterns; an imaging device that images the subject of measurement onto which the interference fringe is projected and generates a plurality of interference fringe images corresponding to at least three different interference fringe patterns in each of a plurality of imaging conditions; and a controller that selects, for each pixel, which imaging condition should be used to compute a phase distribution image of the subject of measurement, and computes a phase of each pixel in the phase distribution image based on the pixel values in the plurality of interference fringe images corresponding to the imaging condition selected for each pixel.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile