The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Jul. 03, 2017
Applicant:

Sharp Kabushiki Kaisha, Sakai, Osaka, JP;

Inventors:

Hidekazu Hayashi, Sakai, JP;

Atsushi Niinoh, Sakai, JP;

Assignee:

SHARP KABUSHIKI KAISHA, Sakai, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09D 5/16 (2006.01); B32B 5/14 (2006.01); B32B 27/16 (2006.01); B32B 27/18 (2006.01); B32B 3/30 (2006.01); C09D 7/65 (2018.01); C08J 5/18 (2006.01); C08J 7/18 (2006.01); B05D 5/08 (2006.01); B05D 1/40 (2006.01); B05D 3/06 (2006.01);
U.S. Cl.
CPC ...
C09D 5/1637 (2013.01); B32B 3/30 (2013.01); B32B 5/14 (2013.01); B32B 27/16 (2013.01); B32B 27/18 (2013.01); C08J 5/18 (2013.01); C08J 7/18 (2013.01); C09D 5/1662 (2013.01); C09D 7/65 (2018.01); B05D 1/40 (2013.01); B05D 3/067 (2013.01); B05D 5/083 (2013.01);
Abstract

The antifouling film includes a polymer layer that includes on a surface thereof an uneven structure provided with multiple projections at a pitch not longer than a wavelength of visible light. The polymer layer has a proportion of the number of fluorine atoms relative to the sum of the numbers of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms of 33 atom % or more on the surface of the uneven structure and of 3 atom % or less on average in a region 90 to 120 nm deep from the surface of the uneven structure. The polymer layer has a proportion of the number of nitrogen atoms relative to the sum of the numbers of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms of 4 atom % or less on average in a region 90 to 120 nm deep from the surface of the uneven structure.


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